Time-dependency of the threshold voltage in memristive devices

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn , Issue , 2011, Pages 2245-2248

  Lehtonen, Eero ^a   Poikonen, Jussi ^a   Laiho, Mika ^a   Lu, Wei ^b  

^a UNIVERSITY OF TURKU   (Finland)

^b UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EFFECT OF PARAMETERS; EXPONENTIAL MODELS; TIME DEPENDENCY; TIME-SCALES;

THIN FILM CIRCUITS;

THRESHOLD VOLTAGE;

EID: 79960884576     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISCAS.2011.5938048     Document Type: Conference Paper

References (9)

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