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Volumn , Issue , 2000, Pages 184-187

A dual-phase-controlled dynamic latched (DDL) amplifier for high-speed and low-power DRAMs

Author keywords

[No Author keywords available]

Indexed keywords

AREA PENALTY; CIRCUIT TECHNOLOGY; CONTROL TECHNIQUES; DEVICE FLUCTUATION; DIFFERENTIAL DATA; OPERATING CURRENTS; OPERATING MARGINS; TRANSFER SCHEME;

EID: 79960869176     PISSN: 19308833     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (2)

References (5)
  • 1
    • 0033221599 scopus 로고    scopus 로고
    • A 2.5-v, 333-mb/s/pin, 1-gbit, double-data-rate synchronous dram
    • Nov.
    • H. Yoon, et al., "A 2.5-V, 333-Mb/s/pin, 1-Gbit, Double-Data-Rate Synchronous DRAM," IEEE J. Solid-State Circ., vol. 34, no. 11, pp. 1589-1598, Nov. 1999.
    • (1999) IEEE J. Solid-State Circ , vol.34 , Issue.11 , pp. 1589-1598
    • Yoon, H.1
  • 2
    • 0032202809 scopus 로고    scopus 로고
    • 500-mb/s nonprecharged data bus for high-speed dram's
    • Nov.
    • M. Saito, et al., "500-Mb/s Nonprecharged Data Bus for High-Speed DRAM's," IEEE J. Solid-State Circ., vol. 33, no. 11, pp. 1720-1729, Nov. 1998.
    • (1998) IEEE J. Solid-State Circ , vol.33 , Issue.11 , pp. 1720-1729
    • Saito, M.1
  • 3
    • 0026257764 scopus 로고
    • A 40-ns 64-mb dram with 64-b parallel data bus architecture
    • Nov.
    • M. Taguchi, et al., "A 40-ns 64-Mb DRAM with 64-b Parallel Data Bus Architecture," IEEE J. Solid-State Circ., vol. 26, no. 11, pp. 1493-1497, Nov. 1991.
    • (1991) IEEE J. Solid-State Circ , vol.26 , Issue.11 , pp. 1493-1497
    • Taguchi, M.1
  • 4
    • 0030241263 scopus 로고    scopus 로고
    • A signal-swing suppressing strategy for power and layout area savings using time-multiplexed differential data-transfer scheme
    • Sep.
    • H. Yamauchi, et al., "A Signal-Swing Suppressing Strategy for Power and Layout Area Savings Using Time-Multiplexed Differential Data-Transfer Scheme," IEEE J. Solid-State Circ., vol. 31, no. 9, pp. 1285-1294, Sep. 1996.
    • (1996) IEEE J. Solid-State Circ , vol.31 , Issue.9 , pp. 1285-1294
    • Yamauchi, H.1
  • 5
    • 5844294997 scopus 로고
    • Circuit techniques for multi-bit parallel testing of 64mb drams and beyond
    • T. Sakuta, et al., "Circuit Techniques for Multi-Bit Parallel Testing of 64Mb DRAMs and Beyond," in Sym. on VLSI Circ. Dig. Tech. Papers, 1992, pp.60-61.
    • (1992) Sym. on VLSI Circ. Dig. Tech. Papers , pp. 60-61
    • Sakuta, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.