On-chip terahertz systems for spectroscopy and imaging

Electronics Letters

Volumn 46, Issue 26, 2010, Pages

  Cunningham, J ^a   Byrne, M B ^a   Wood, C D ^a   Dazhang, L ^a  

^a UNIVERSITY OF LEEDS   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION LIMITS; FREE SPACE; FUTURE APPLICATIONS; INTEGRATED SYSTEMS; INTEGRATED TERAHERTZ; LENGTH SCALE; ON CHIPS; ON-CHIP SYSTEMS; PHOTOCONDUCTIVE DETECTION; PHOTOCONDUCTIVE MATERIALS; SAMPLE VOLUME; TERAHERTZ FIELDS; TERAHERTZ FREQUENCIES; TERAHERTZ SYSTEMS; TIME DOMAIN SPECTROSCOPY; TIME-DOMAIN TERAHERTZ SPECTROSCOPY;

PHOTOCONDUCTIVITY; TERAHERTZ WAVES;

TERAHERTZ SPECTROSCOPY;

EID: 79960808537     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el.2010.3317     Document Type: Review

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