Terahertz evanescent field microscopy of dielectric materials using on-chip waveguides

Applied Physics Letters

Volumn 92, Issue 3, 2008, Pages

  Cunningham, J ^a   Byrne, M ^a   Upadhya, P ^a   Lachab, M ^a   Linfield, E H ^a   Davies, A G ^a  

^a UNIVERSITY OF LEEDS   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

FREQUENCY RESPONSE; MICROSCOPIC EXAMINATION; PULSE AMPLITUDE MODULATION; TIME DOMAIN ANALYSIS; WAVEGUIDES;

MICROSTRIP EVANESCENT FIELD; TERAHERTZ FREQUENCY PROPERTIES; TIME-DOMAIN MEASUREMENTS;

DIELECTRIC MATERIALS;

EID: 38549121223     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2835705     Document Type: Article

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