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Volumn 12, Issue 11, 2011, Pages 2169-2176

Alternating-current measurements in scanning electrochemical microscopy, part 1: Principle and theory

Author keywords

diffusion; electrochemistry; numerical simulations; scanning electrochemical microscopy; scanning probe microscopy

Indexed keywords

COMPUTER SIMULATION; DIFFUSION; ELECTRIC IMPEDANCE MEASUREMENT; NUMERICAL MODELS; SCANNING ELECTRON MICROSCOPY; SCANNING PROBE MICROSCOPY;

EID: 79960764761     PISSN: 14394235     EISSN: 14397641     Source Type: Journal    
DOI: 10.1002/cphc.201001084     Document Type: Article
Times cited : (18)

References (44)
  • 2
    • 13844313211 scopus 로고    scopus 로고
    • Instrumentation: in (Eds.: A. J. Bard, M. V. Mirkin), Marcel Dekker, New York
    • Instrumentation:, D. O. Wipf, in Scanning Electrochemical Microscopy (Eds.:, A. J. Bard, M. V. Mirkin,), Marcel Dekker, New York, 2001, pp. 17-74.
    • (2001) Scanning Electrochemical Microscopy , pp. 17-74
    • Wipf, D.O.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.