SCOPUS 정보 검색 플랫폼

Volumn 50, Issue 7 PART 1, 2011, Pages

Structural analysis and direct imaging of rotational stacking faults in few-layer graphene synthesized from solid botanical precursor

(3) Kalita, Golap a Wakita, Koichi a Umeno, Masayoshi a

a CHUBU UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIRECT IMAGING; GAIN INSIGHT; GRAPHENE LAYERS; GRAPHENE SHEETS; HEXAGONAL STRUCTURES; LOW-VOLTAGE; MOIRE PATTERN; RELATIVE ROTATION; SECOND ORDERS; SINGLE LAYER; TRANSMISSION ELECTRON MICROSCOPY IMAGES;

HIGH RESOLUTION ELECTRON MICROSCOPY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; PYROLYSIS; RAMAN SPECTROSCOPY; STACKING FAULTS; STRUCTURAL ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

GRAPHENE;

EID: 79960679744 PISSN: 00214922 EISSN: 13474065 Source Type: Journal
DOI: 10.1143/JJAP.50.070106 Document Type: Article

Times cited : (6)

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