Contact angle hysteresis at the nanometer scale

Physical Review Letters

Volumn 106, Issue 13, 2011, Pages

  Delmas, Mathieu ^a   Monthioux, Marc ^a   Ondarçuhu, Thierry ^a  

^a CEMES CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT ANGLE HYSTERESIS; DEFECT SIZE; DISSIPATED ENERGY; LIQUID CONTACT; NANO-METER SCALE; NANOMETRICS;

ATOMIC FORCE MICROSCOPY; CONTACT ANGLE; DEFECTS;

HYSTERESIS;

EID: 79960630237     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.106.136102     Document Type: Article

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