Advancing contact lines on chemically patterned surfaces

Journal of Colloid and Interface Science

Volumn 269, Issue 1, 2004, Pages 171-177

  Cubaud, T ^a   Fermigier, M ^a  

^a ESPCI   (France)

Author keywords

Cassie; Contact angle; Contact line; Defects; Heterogeneous; Hysteresis; Partial wetting; Patterned

Indexed keywords

PATTERNMAKING; PHOTOLITHOGRAPHY; SURFACE PROPERTIES; WETTING; CONTACT ANGLE; DEFECTS; DROPS; EXPERIMENTS; HYSTERESIS;

CONTACT LINES; CASSIE; HETEROGENEOUS; PARTIAL WETTING; PATTERNED;

SURFACE CHEMISTRY; SURFACE DEFECTS;

ARTICLE; CONTACT ANGLE; EXPERIMENTATION; GEOMETRY; MATHEMATICAL COMPUTING; MEASUREMENT; MICROPHOTOGRAPHY; MOLECULAR MODEL; PRIORITY JOURNAL; WETTABILITY;

EID: 0345357119     PISSN: 00219797     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcis.2003.08.008     Document Type: Article

References (26)

1. Darhuber A.A., Troian S.M. J. Appl. Phys. 90:2001;3602-3609.
2. Martin A., Rossier O., Buguin A., Auroy P., Brochard-Wyart F. Eur. Phys. J. E. 3:2000;337-341.
3. Gau H., Herminghaus S., Lenz P., Lipowsky R. Science. 283:1999;46-49.
4. Smith T., Lindberg G. J. Colloid Interface Sci. 66:1978;363-366.
5. Andrieu C., Sykes C., Brochard F. Langmuir. 10:1994;2077-2080.
6. Marsh J., Cazabat A. Phys. Rev. Lett. 71:1993;2433-2436.
7. Nadkarni G., Garoff S. Europhys. Lett. 20:1992;523-528.
8. di Meglio J.-M. Europhys. Lett. 17:1992;607-612.
9. Paterson A., Fermigier M. Phys. Fluids. 9:1997;2210.
10. Chatain D., de Jonghe V. J. Adhes. 58:1996;163-171.
11. Prevost A., Rolley E., Guthmann C. Phys. Rev. Lett. 83:1999;348-351.
12. de Gennes P.-G. Rev. Mod. Phys. 57:1985;827-863.
13. Cubaud T., Fermigier M. Europhys. Lett. 55:2001;239-245.
14. Cubaud T., Fermigier M. Oil Gas Sci. Technol. Rev. IFP. 56:2001;23-31.
15. Tanguy A., Gounelle M., Roux S. Phys. Rev. E. 58:1998;1577-1590.
16. Jain A. Fundamentals of Digital Image Processing. 1989;Prentice Hall, New York.
17. Cassie A., Baxter S. S. Trans. Faraday Soc. 40:1944;546.
18. Israelachvili J., Gee M. Langmuir. 5:1989;288-289.
19. Drelich J., Wilbur J.L., Miller J.D., Whitesides G.M. Langmuir. 12:1996;1913-1922.
20. Oner D., McCarthy J. Langmuir. 16:2000;7777-7782.
21. Herzberg W.J., Marian J.E., Vermeulen T. J. Colloid Interface Sci. 33:1970;164-171.
22. Dettre R., Johnson R. J. Physical Chemistry. 69:1965;1507-1515.
23. Semal S., Voué M., de Ruijter M.J., Dehuit J., Coninck J.D. J. Phys. Chem. B. 103:1999;4854-4861.
24. Woodward J.T., Gwin H., Schwartz D.K. Langmuir. 16:2000;2957-2961.
25. Drelich J. Polish. J. Chem. 71:1997;525-549.
26. Buehrle J., Herminghaus S., Mugele F. Langmuir. 18:2002;9771-9777.