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Physical Review Letters

Volumn 106, Issue 20, 2011, Pages

InN thin film lattice dynamics by grazing incidence inelastic X-ray scattering

(9) Serrano, J a Bosak, A b Krisch, M b Manjon F J c Romero, A H d Garro, N e Wang, X f Yoshikawa, A g Kuball, M h

a UNIVERSITAT POLITÈCNICA DE CATALUNYA (Spain)

b EUROPEAN SYNCHROTRON RADIATION FACILITY (France)

c UNIVERSITAT POLITÈCNICA DE VALÈNCIA (Spain)

d DEPARTAMENTO DE FÍSICA (Mexico)

e UNIVERSITY OF VALENCIA (Spain)

f PEKING UNIVERSITY (China)

g CHIBA UNIVERSITY (Japan)

h UNIVERSITY OF BRISTOL (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AB INITIO CALCULATIONS; COMPREHENSIVE INFORMATION; ELASTIC STIFFNESS; GRAZING INCIDENCE; GROUP III NITRIDES; INDIUM NITRIDE; INDIUM NITRIDE FILMS; INELASTIC X RAY SCATTERING; INN THIN FILMS; LOW ENERGIES; NOVEL APPLICATIONS; OPTIC PHONON; SOLAR-CELL APPLICATIONS; SPECTROSCOPIC TECHNIQUE; WURTZITES;

CALCULATIONS; INDIUM; LATTICE VIBRATIONS; NITRIDES; OPTICS; SOLIDS; THIN FILMS; X RAY SCATTERING; ZINC SULFIDE;

SCATTERING;

EID: 79960493338 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.106.205501 Document Type: Article

Times cited : (46)

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