Particle number density gradient samples for nanoparticle metrology with atomic force microscopy

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8036, Issue , 2011, Pages

  Lawn, Malcolm A ^a   Goreham, Renee V ^b   Jan, Herrmann ^a   Jämting, Åsa K ^a  

^a NATIONAL MEASUREMENT INSTITUTE   (Australia)

^b UNIVERSITY OF SOUTH AUSTRALIA   (Australia)

Author keywords

AFM; Nanometrology; Nanoparticle; Particle number density gradient; Substrate functionalization

Indexed keywords

ACCURATE MEASUREMENT; AFM; AFM IMAGING; DIFFERENTIAL CENTRIFUGAL SEDIMENTATIONS; DIMENSIONAL MEASUREMENTS; FUNCTIONALIZED; GOLD NANOPARTICLES; HEIGHT MEASUREMENT; MEASUREMENT RESULTS; NANOMETROLOGY; NUMBER DENSITY; PARTICLE AGGLOMERATIONS; PARTICLE NUMBER DENSITY; PARTICLE NUMBER DENSITY GRADIENT; SUBSTRATE FUNCTIONALIZATION;

AGGLOMERATION; CENTRIFUGATION; GOLD COATINGS; NANOPARTICLES; SECURITY SYSTEMS; SUBSTRATES; UNITS OF MEASUREMENT;

ATOMIC FORCE MICROSCOPY;

EID: 79960388644     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.884566     Document Type: Conference Paper

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