Quantitative Fourier analysis of schlieren masks: The transition from shadowgraph to schlieren

Applied Optics

Volumn 50, Issue 20, 2011, Pages 3419-3427

  Croccolo, Fabrizio ^a,b   Brogioli, Doriano ^a,c  

^a UNIVERSITY OF MILAN   (Italy)

^b UNIVERSITY OF FRIBOURG   (Switzerland)

^c UNIVERSITY OF MILANO BICOCCA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

FOURIER ANALYSIS;

FOURIER PLANES; LENS SYSTEMS; QUANTITATIVE FOURIER ANALYSIS; REFRACTIVE INDEX FLUCTUATIONS; SCATTERING MEASUREMENTS; SPATIAL FILTERINGS; SPATIAL FREQUENCY; TRANSPARENT FLUIDS;

REFRACTIVE INDEX;

ALGORITHM; ARTICLE; ENGINEERING; EQUIPMENT DESIGN; FOURIER ANALYSIS; LIGHT; METHODOLOGY; OPTICAL INSTRUMENTATION; OPTICS; RADIATION SCATTERING; REFRACTOMETRY; STATISTICAL MODEL;

ALGORITHMS; ENGINEERING; EQUIPMENT DESIGN; FOURIER ANALYSIS; LENSES; LIGHT; MODELS, STATISTICAL; OPTICS AND PHOTONICS; REFRACTOMETRY; SCATTERING, RADIATION;

EID: 79960220994     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.50.003419     Document Type: Article

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