Nanoparticle characterization by using Tilted laser microscopy: Back scattering measurement in near field

Optics Express

Volumn 17, Issue 18, 2009, Pages 15431-15448

  Brogioli, D ^a   Salerno, D ^a   Cassina, V ^a   Mantegazza, F ^a  

^a UNIVERSITY OF MILANO BICOCCA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; LIGHT SCATTERING; MICROSCOPES; NANOPARTICLES;

BACKSCATTERING MEASUREMENT; CHARACTERIZATION OF NANOPARTICLES; DYNAMIC SCATTERING; LASER ILLUMINATION; NEAR-FIELD SCATTERING; SPHERICAL NANOPARTICLES; STATIC AND DYNAMIC LIGHT SCATTERING; STOKES EINSTEIN EQUATIONS;

FORWARD SCATTERING;

NANOPARTICLE;

ARTICLE; CHEMISTRY; CONFOCAL MICROSCOPY; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; LIGHT; PHOTOMETRY; RADIATION SCATTERING; REFRACTOMETRY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; ULTRASTRUCTURE;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; LIGHT; MICROSCOPY, CONFOCAL; NANOPARTICLES; NEPHELOMETRY AND TURBIDIMETRY; PHOTOMETRY; REFRACTOMETRY; REPRODUCIBILITY OF RESULTS; SCATTERING, RADIATION; SENSITIVITY AND SPECIFICITY;

EID: 69949083487     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.17.015431     Document Type: Article

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40. A practical interactive program to calculate Mie scattering can be found at the following address: http://omlc.ogi.edu/calc/miecalc.html.