The depth profile of core energy levels: Electronic structure of buried organic/metal interfaces examined by X-ray photoemission and target factor analysis

Chemical Physics Letters

Volumn 511, Issue 1-3, 2011, Pages 146-150

  Yoshida, Hiroyuki ^a,b   Sato, Naoki ^a  

^a KYOTO UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLE VARIATION; BURIED INTERFACE; CORE ENERGY; DEPTH PROFILE; DETECTION ANGLE; ELECTRONIC LEVELS; METAL SURFACES; NEW EXPERIMENTAL METHOD; ORGANIC SEMICONDUCTOR; ORGANIC/METAL INTERFACES; TARGET FACTOR ANALYSIS; X RAY PHOTOEMISSION SPECTROSCOPY; X-RAY PHOTOEMISSIONS; XPS DATA;

ELECTRONIC STRUCTURE; PHOTOEMISSION; X RAY PHOTOELECTRON SPECTROSCOPY;

EMISSION SPECTROSCOPY;

EID: 79960206327     PISSN: 00092614     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cplett.2011.05.034     Document Type: Article

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