A probabilistic approach to system maturity assessment

Systems Engineering

Volumn 14, Issue 3, 2011, Pages 279-293

  Tan, Weiping ^a   Ramirez Marquez, Jose ^a   Sauser, Brian ^a  

^a STEVENS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Integration Readiness Level; prescriptive metric; subjectivity; System Readiness Level; Technology Readiness Level

Indexed keywords

INTEGRATION READINESS; PRESCRIPTIVE METRIC; SUBJECTIVITY; SYSTEM READINESS LEVEL; TECHNOLOGY READINESS LEVEL;

ESTIMATION; RATING;

PROBABILITY DISTRIBUTIONS;

EID: 79960184201     PISSN: 10981241     EISSN: 15206858     Source Type: Journal    
DOI: 10.1002/sys.20179     Document Type: Article

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