SCOPUS 정보 검색 플랫폼

IEEE Transactions on Software Engineering

Volumn 28, Issue 6, 2002, Pages 529-547

A methodology for architecture-level reliability risk analysis

(2) Yacoub, Sherif M a,b Ammar, Hany H a,c

a IEEE (United States)

b HEWLETT PACKARD LABORATORIES (United States)

c West Virginia University (United States)

Author keywords

Component dependency graphs; Dynamic metrics; Reliability risk analysis; Risk assessment; Risk modeling; Severity measures; Software architecture

Indexed keywords

COMPONENT-DEPENDENCY GRAPHS; FAILURE MODE AND EFFECT ANALYSIS; RELIABILITY RISK ANALYSIS; SEVERITY MEASURES;

ALGORITHMS; COMPUTER ARCHITECTURE; FAILURE ANALYSIS; GRAPH THEORY; HEURISTIC METHODS; LIFE CYCLE; MATHEMATICAL MODELS; PROBABILITY; RELIABILITY; RISK ASSESSMENT;

SOFTWARE ENGINEERING;

EID: 0036612912 PISSN: 00985589 EISSN: None Source Type: Journal
DOI: 10.1109/TSE.2002.1010058 Document Type: Article

Times cited : (130)

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