Ultrafast manipulation of hard x-rays by efficient Bragg switches

Applied Physics Letters

Volumn 96, Issue 16, 2010, Pages

  Herzog, M ^a   Leitenberger, W ^a   Shayduk, R ^b   Van Der Veen, R M ^c,d   Milne, C J ^c,d   Johnson, S L ^c   Vrejoiu, I ^e   Alexe, M ^e   Hesse, D ^e   Bargheer, M ^a,b,f  

^a UNIVERSITY OF POTSDAM   (Germany)

^b HAHN MEITNER INSTITUT   (Germany)

^c PAUL SCHERRER INSTITUTE   (Switzerland)

^d EPFL   (Switzerland)

^e MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

^f MAX PLANCK INSTITUTE OF COLLOIDS AND INTERFACES   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CONTRAST RATIO; HARD X RAY; HIGH REFLECTIVITY; NUMERICAL SIMULATION; OPTICAL EXCITATIONS; ORDER OF MAGNITUDE; ROCKING CURVES; SRTIO; TIME-SCALES; ULTRAFAST MANIPULATION; X-RAY STRUCTURE FACTOR;

COMPUTER SIMULATION; LASER OPTICS; PHONONS; PHOTOEXCITATION; REFLECTION;

SUPERLATTICES;

EID: 77951815539     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3402773     Document Type: Article

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19. The assumption of perfect interfaces in the simulation, i.e., no intermixing, is not crucial. The presence of three intermixed unit cells would diminish the switching ratio by less than a factor of 2 with almost unchanged maximum reflectivity.