-
1
-
-
55449115308
-
Storage-class memory: The next storage system technology
-
R. F. Freitas and W. W. Wilcke, "Storage-class memory: The next storage system technology," IBMJ. Res. Dev., vol. 52, no. 4/5, pp. 439-447, 2008.
-
(2008)
IBMJ. Res. Dev.
, vol.52
, Issue.4-5
, pp. 439-447
-
-
Freitas, R.F.1
Wilcke, W.W.2
-
2
-
-
77957895258
-
Thermal disturbance and its impact on reliability of phase-change memory studied by the micro-thermal stage
-
S. Kim, B. Lee, M. Asheghi, G. A. M. Hurkx, J. Reifenberg, K. Goodson, and H.-S. P. Wong, "Thermal disturbance and its impact on reliability of phase-change memory studied by the micro-thermal stage," in Proc. IEEE IRPS, 2010, pp. 99-103.
-
(2010)
Proc. IEEE IRPS
, pp. 99-103
-
-
Kim, S.1
Lee, B.2
Asheghi, M.3
Hurkx, G.A.M.4
Reifenberg, J.5
Goodson, K.6
Wong, H.-S.P.7
-
3
-
-
67349254101
-
Reliability impact of chalcogenide-structure relaxation in phase-change memory (PCM) cells-part I: Experimental study
-
May
-
D. Ielmini, D. Sharma, S. Lavizzari, and A. L. Lacaita, "Reliability impact of chalcogenide-structure relaxation in phase-change memory (PCM) cells-Part I: Experimental study," IEEE Trans. Electron Devices, vol. 56, no. 5, pp. 1070-1077, May 2009.
-
(2009)
IEEE Trans. Electron Devices
, vol.56
, Issue.5
, pp. 1070-1077
-
-
Ielmini, D.1
Sharma, D.2
Lavizzari, S.3
Lacaita, A.L.4
-
4
-
-
2442604559
-
Low-field amorphous state resistance and threshold voltage drift in chalcogenide materials
-
May
-
A. Pirovano, A. L. Lacaita, F. Pellizzer, S. A. Kostylev, A. Benvenuti, and R. Bez, "Low-field amorphous state resistance and threshold voltage drift in chalcogenide materials," IEEE Trans. Electron Devices, vol. 51, no. 5, pp. 714-719, May 2004.
-
(2004)
IEEE Trans. Electron Devices
, vol.51
, Issue.5
, pp. 714-719
-
-
Pirovano, A.1
Lacaita, A.L.2
Pellizzer, F.3
Kostylev, S.A.4
Benvenuti, A.5
Bez, R.6
-
5
-
-
47249119179
-
Novel lithography-independent pore phase change memory
-
M. Breitwisch et al., "Novel lithography-independent pore phase change memory," in Proc. Symp. VLSI Tech., 2007, pp. 100-101.
-
(2007)
Proc. Symp. VLSI Tech.
, pp. 100-101
-
-
Breitwisch, M.1
-
6
-
-
82155199591
-
Device, circuit and system-level analysis of noise in multi-bit phase-change memory
-
G. F. Close, U. Frey, M. Breitwisch, H. L. Lung, C. Lam, C. Hagleitner, and E. Eleftheriou, "Device, circuit and system-level analysis of noise in multi-bit phase-change memory," in Proc. IEDM Tech. Dig., 2010, pp. 660-663.
-
(2010)
Proc. IEDM Tech. Dig.
, pp. 660-663
-
-
Close, G.F.1
Frey, U.2
Breitwisch, M.3
Lung, H.L.4
Lam, C.5
Hagleitner, C.6
Eleftheriou, E.7
-
7
-
-
79960855650
-
Programming algorithms for multilevel phase-change memory
-
N. Papandreou, H. Pozidis, A. Pantazi, A. Sebastian, M. Breitwisch, C. Lam, and E. Eleftheriou, "Programming algorithms for multilevel phase-change memory," in Proc. IEEE ISCAS, 2011.
-
(2011)
Proc. IEEE ISCAS
-
-
Papandreou, N.1
Pozidis, H.2
Pantazi, A.3
Sebastian, A.4
Breitwisch, M.5
Lam, C.6
Eleftheriou, E.7
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