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Volumn , Issue , 2011, Pages

Drift-tolerant multilevel phase-change memory

Author keywords

[No Author keywords available]

Indexed keywords

4-LEVEL; CODEWORD; CODING TECHNIQUES; MEMORY TECHNOLOGY; MODULATION CODING; PHASE CHANGES; PROTOTYPE CHIP; RELATIVE ORDER; RESISTANCE LEVEL; ROOM TEMPERATURE; STOCHASTIC NATURE;

EID: 79960015315     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IMW.2011.5873231     Document Type: Article
Times cited : (99)

References (7)
  • 1
    • 55449115308 scopus 로고    scopus 로고
    • Storage-class memory: The next storage system technology
    • R. F. Freitas and W. W. Wilcke, "Storage-class memory: The next storage system technology," IBMJ. Res. Dev., vol. 52, no. 4/5, pp. 439-447, 2008.
    • (2008) IBMJ. Res. Dev. , vol.52 , Issue.4-5 , pp. 439-447
    • Freitas, R.F.1    Wilcke, W.W.2
  • 2
    • 77957895258 scopus 로고    scopus 로고
    • Thermal disturbance and its impact on reliability of phase-change memory studied by the micro-thermal stage
    • S. Kim, B. Lee, M. Asheghi, G. A. M. Hurkx, J. Reifenberg, K. Goodson, and H.-S. P. Wong, "Thermal disturbance and its impact on reliability of phase-change memory studied by the micro-thermal stage," in Proc. IEEE IRPS, 2010, pp. 99-103.
    • (2010) Proc. IEEE IRPS , pp. 99-103
    • Kim, S.1    Lee, B.2    Asheghi, M.3    Hurkx, G.A.M.4    Reifenberg, J.5    Goodson, K.6    Wong, H.-S.P.7
  • 3
    • 67349254101 scopus 로고    scopus 로고
    • Reliability impact of chalcogenide-structure relaxation in phase-change memory (PCM) cells-part I: Experimental study
    • May
    • D. Ielmini, D. Sharma, S. Lavizzari, and A. L. Lacaita, "Reliability impact of chalcogenide-structure relaxation in phase-change memory (PCM) cells-Part I: Experimental study," IEEE Trans. Electron Devices, vol. 56, no. 5, pp. 1070-1077, May 2009.
    • (2009) IEEE Trans. Electron Devices , vol.56 , Issue.5 , pp. 1070-1077
    • Ielmini, D.1    Sharma, D.2    Lavizzari, S.3    Lacaita, A.L.4
  • 4
  • 5
    • 47249119179 scopus 로고    scopus 로고
    • Novel lithography-independent pore phase change memory
    • M. Breitwisch et al., "Novel lithography-independent pore phase change memory," in Proc. Symp. VLSI Tech., 2007, pp. 100-101.
    • (2007) Proc. Symp. VLSI Tech. , pp. 100-101
    • Breitwisch, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.