Monitoring annealing via CO2 laser heating of defect populations on fused silica surfaces using photoluminescence microscopy

Optics Express

Volumn 18, Issue 14, 2010, Pages 15207-15215

  Raman, Rajesh N ^a   Matthews, Manyalibo J ^a   Adams, John J ^a   Demos, Stavros G ^a  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON DIOXIDE; CARBON DIOXIDE LASERS; LASER BEAMS; LASER EXCITATION; PHOTOLUMINESCENCE; SURFACE DEFECTS;

ANALYTIC SOLUTION; DEFECT CONCENTRATIONS; DEFECT POPULATION; HEAT FLOW EQUATIONS; IN- SITU MONITORING; OPTICAL COMPONENTS; PHOTOLUMINESCENCE MICROSCOPY; SURFACE TEMPERATURES;

FUSED SILICA;

EID: 79959978153     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.18.015207     Document Type: Article

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