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Volumn 166, Issue , 2000, Pages 698-703

In situ diagnostics of pulse laser-induced defects in DUV transparent fused silica glasses

Author keywords

[No Author keywords available]

Indexed keywords

EXCIMER LASERS; FLUORESCENCE; LASER BEAMS; LASER PULSES; OPTICAL GLASS; RADIATION DAMAGE; RAMAN SPECTROSCOPY; REFRACTIVE INDEX; TRANSPARENCY;

EID: 0342410328     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(99)00727-2     Document Type: Article
Times cited : (20)

References (8)
  • 6
    • 84992262401 scopus 로고    scopus 로고
    • Nikon Corp., JP 10019727 A (1996)
    • Nikon Corp., JP 10019727 A (1996).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.