Partial intensity approach for quantitative analysis of reflection-electron-energy-loss spectra

Surface Science

Volumn 605, Issue 15-16, 2011, Pages 1568-1576

  Calliari, L ^a   Filippi, M ^a   A Varfolomeev, ^b  

^a FONDAZIONE BRUNO KESSLER   (Italy)

^b KURCHATOV INSTITUTE   (Russian Federation)

Author keywords

Electron energy loss spectroscopy (EELS); Electron solid interactions; Plasmons; Silicon; Solid gas interfaces

Indexed keywords

DISSOCIATION; ELECTRON ENERGY ANALYZERS; ELECTRON SCATTERING; ELECTRONS; ENERGY DISSIPATION; PHASE INTERFACES; PLASMONS; REELS; SILICON;

CYLINDRICAL MIRROR ANALYZER; ELECTRON ENERGY LOSS; ELECTRON ENERGY LOSS SPECTRUM; ELECTRON-SOLID INTERACTION; INELASTIC MEAN FREE PATH; SOLID-GAS INTERFACE; SURFACE CONTRIBUTION; SURFACE EXCITATION PARAMETERS;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 79959842761     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2011.05.031     Document Type: Article

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