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Volumn 163, Issue 1-3, 2008, Pages 7-14

A simple statistical model for quantitative analysis of plasmon structures in XPS and Auger spectra of free-electron-like materials

Author keywords

Auger; Energy loss; Plasmon structure; Quantitative analysis; XPS

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; ENERGY DISSIPATION; INELASTIC SCATTERING; MOLECULAR STRUCTURE; STATISTICAL MECHANICS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 43849093487     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2007.11.002     Document Type: Article
Times cited : (10)

References (36)
  • 3
    • 43849106953 scopus 로고    scopus 로고
    • S. Tougaard, QUASES-Tougaard: Software Package for Quantitative Analysis of Surface by Electron Spectroscopy, Version 5.1 (2005) (see www.quases.com).
    • S. Tougaard, QUASES-Tougaard: Software Package for Quantitative Analysis of Surface by Electron Spectroscopy, Version 5.1 (2005) (see www.quases.com).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.