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Volumn 163, Issue 1-3, 2008, Pages 7-14
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A simple statistical model for quantitative analysis of plasmon structures in XPS and Auger spectra of free-electron-like materials
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Author keywords
Auger; Energy loss; Plasmon structure; Quantitative analysis; XPS
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Indexed keywords
AUGER ELECTRON SPECTROSCOPY;
ENERGY DISSIPATION;
INELASTIC SCATTERING;
MOLECULAR STRUCTURE;
STATISTICAL MECHANICS;
X RAY PHOTOELECTRON SPECTROSCOPY;
FREE-ELECTRON-LIKE MATERIALS;
PHOTOELECTRON SPECTRUM;
PLASMON STRUCTURE;
STATISTICAL MODELS;
PLASMONS;
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EID: 43849093487
PISSN: 03682048
EISSN: None
Source Type: Journal
DOI: 10.1016/j.elspec.2007.11.002 Document Type: Article |
Times cited : (10)
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References (36)
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