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Volumn 109, Issue 11, 2011, Pages

Nano-engineered defect structures in Ce- and Ho-doped metal-organic chemical vapor deposited YBa2Cu3O6+δ films: Correlation of structure and chemistry with flux pinning performance

(11) Aytug, T a Chen, Z b Maroni, V A b Miller, D J b Cantoni, C a Specht, E D a Kropf, A J b Zaluzec, N b Zhang, Y a Zuev, Y a Paranthaman, M a

a OAK RIDGE NATIONAL LABORATORY (United States)

b ARGONNE NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITED; DOPED SAMPLE; DOPING STRATEGIES; EXTENDED RANGE; FIELD ANGLE; FIELD ORIENTATION; HIGH DENSITY; IN-FIELD; MAGNETIC FIELD ORIENTATIONS; MATRIX; METAL-ORGANIC; MICRO-STRUCTURAL; NANOCRYSTALLINE PHASIS; NANOPRECIPITATES; PINNING PROPERTIES; PLANAR ARRAYS; RAMAN MICROSPECTROSCOPY; SELF FIELD; SUPERCONDUCTING MATRIX; VAPOR PHASE DEPOSITION; YBCO FILM;

ABSORPTION SPECTROSCOPY; BARIUM; CHEMICAL PROPERTIES; CRYSTAL MICROSTRUCTURE; ELECTRIC PROPERTIES; FLUX PINNING; HOLMIUM; INDUSTRIAL CHEMICALS; MAGNETIC FIELDS; ORGANIC CHEMICALS; POINT DEFECTS; PRECIPITATES; PRECIPITATION (CHEMICAL); SEMICONDUCTOR DOPING; STRIP METAL; SUPERCONDUCTING FILMS; TRANSMISSION ELECTRON MICROSCOPY; VAPORS; X RAY DIFFRACTION; YTTRIUM BARIUM COPPER OXIDES; ZIRCONIUM;

CERIUM;

EID: 79959437617 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3592244 Document Type: Article

Times cited : (12)

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