A lifespan-aware reliability scheme for RAID-based flash storage

Proceedings of the ACM Symposium on Applied Computing

Volumn , Issue , 2011, Pages 374-379

  Lee, Sehwan ^a   Lee, Bitna ^a   Koh, Kern ^a   Bahn, Hyokyung ^b  

^a Seoul National University   (South Korea)

^b Ewha Womans University   (South Korea)

Author keywords

FTL (flash translation layer); NAND flash memory; RAID; reliability; SSD (solid state drive)

Indexed keywords

DATA BLOCKS; ERROR CORRECTION CODES; ERROR RATE; FLASH DEVICES; FLASH STORAGE; FLASH TRANSLATION LAYER; HIGH RELIABILITY; HIGH-END SERVERS; I/O PERFORMANCE; LIFE SPAN; LOG BLOCKS; LOW-POWER CONSUMPTION; MAPPING SCHEME; MULTILEVEL CELL; NAND FLASH MEMORY; PROGRAM/ERASE; RAID; RELIABILITY PROBLEMS; SIMULATION EXPERIMENTS; SPACE OVERHEAD; SSD (SOLID STATE DRIVE);

BIT ERROR RATE; RELIABILITY;

FLASH MEMORY;

EID: 79959321669     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1982185.1982266     Document Type: Conference Paper

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