FRA: A flash-aware redundancy array of flash storage devices

Embedded Systems Week 2009 - 7th IEEE/ACM International Conference on Hardware/Software-Co-Design and System Synthesis, CODES+ISSS 2009

Volumn , Issue , 2009, Pages 163-171

  Lee, Yangsup ^a   Jung, Sanghyuk ^b   Song, Yong Ho ^b  

^a SAMSUNG Electronics   (South Korea)

^b Hanyang University   (South Korea)

Author keywords

Flash memory; Flash translation layer; RAID; Storage systems

Indexed keywords

CRITICAL PATHS; DELAYED RESPONSE TIME; FLASH STORAGE; FLASH TRANSLATION LAYER; HARD DISKS; I/O LATENCY; LOW-POWER CONSUMPTION; MULTI-BITS; NONVOLATILITY; RAID; RAID STORAGE; RESPONSE TIME; SHOCK RESISTANCE; STORAGE MEDIA; STORAGE TECHNOLOGY; WRITE OPERATIONS;

COMPUTER VISION; EMBEDDED SYSTEMS; QUALITY ASSURANCE; REDUNDANCY; RESPONSE TIME (COMPUTER SYSTEMS);

FLASH MEMORY;

EID: 72149108693     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1629435.1629459     Document Type: Conference Paper

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