Variation-aware stochastic extraction with large parameter dimensionality: Review and comparison of state of the art intrusive and non-intrusive techniques

Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011

Volumn , Issue , 2011, Pages 508-517

  El Moselhy, Tarek ^a   Daniel, Luca ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE EXTRACTION; COMPLEX IMPEDANCE; GEOMETRICAL VARIATIONS; HERMITE EXPANSION; IMPEDANCE EXTRACTION; MANUFACTURING PROCESS; NEUMANN EXPANSION; NON-INTRUSIVE; NON-INTRUSIVE TECHNIQUES; RANDOM WALK ALGORITHMS; SAMPLING-BASED; SINGULAR VECTORS; STATE OF THE ART; STOCHASTIC EXTRACTION; STOCHASTIC GALERKIN METHODS; STOCHASTIC MODEL REDUCTION;

ALGORITHMS; CAPACITANCE; GALERKIN METHODS; STOCHASTIC SYSTEMS;

STOCHASTIC MODELS;

EID: 79959232666     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2011.5770775     Document Type: Conference Paper

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