|
Volumn 7973, Issue , 2011, Pages
|
Mandrel based patterning: Density multiplication techniques for 15nm nodes
|
Author keywords
15nm; BEOL routing; Directed self assembly; DSA; EUV; Lithography; Mandrel; Patterning; PS b PMMA; Quadruple patterning; SADP; Self aligned double patterning; Sidewall spacer; Stencil; Triple patterning
|
Indexed keywords
15NM;
BEOL ROUTING;
DIRECTED SELF-ASSEMBLY;
DSA;
EUV;
MANDREL;
PATTERNING;
PS-B-PMMA;
QUADRUPLE PATTERNING;
SADP;
SELF-ALIGNED;
SIDEWALL SPACER;
STENCIL;
TRIPLE PATTERNING;
LOGIC DESIGN;
NANOTECHNOLOGY;
SELF ASSEMBLY;
LITHOGRAPHY;
|
EID: 79959187556
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.881679 Document Type: Conference Paper |
Times cited : (27)
|
References (7)
|