Necessity of a thorough characterization of functionalized silicon wafers before biointerface studies

Journal of Physical Chemistry C

Volumn 115, Issue 22, 2011, Pages 11102-11111

  Böhmler, Judith ^a   Ploux, Lydie ^a   Ball, Vincent ^b   Anselme, Karine ^a   Ponche, Arnaud ^a  

^a UNIVERSITÉ DE HAUTE ALSACE   (France)

^b INSERM   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AFM IMAGE; BIOINTERFACES; BIOLOGICAL APPLICATIONS; FUNCTIONALIZED; HIGH-RESOLUTION SPECTRA; MODEL SURFACE; MOLECULAR LAYER; PARTIAL SURFACES; SAMS;

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; CHARACTERIZATION; CONTACT ANGLE; GRAFTING (CHEMICAL); ORGANIC POLYMERS; PHOTOELECTRON SPECTROSCOPY; SELF ASSEMBLED MONOLAYERS; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS; X RAY PHOTOELECTRON SPECTROSCOPY; ZETA POTENTIAL;

SURFACE REACTIONS;

EID: 79958732558     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp201377n     Document Type: Article

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