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Volumn 519, Issue 19, 2011, Pages 6583-6586

Light intensity effects on electrical properties of AgIn5S 8 thin films

Author keywords

Chalcogenide; Electronic transport; Evaporation; Grain boundaries; Illumination; Thin films

Indexed keywords

A-DENSITY; CONDUCTIVITY ACTIVATION ENERGY; CONDUCTIVITY MEASUREMENTS; CURRENT CONDUCTION MECHANISMS; DENSITY OF LOCALIZED STATE; ELECTRICAL CONDUCTIVITY; ELECTRICAL MEASUREMENT; ELECTRON-HOLE RECOMBINATION; ELECTRONIC TRANSPORT; EXCITATION INTENSITY; HOPPING DISTANCES; HOPPING ENERGIES; LIGHT ILLUMINATION; LIGHT INTENSITY; LOCALIZATION LENGTH; POLYCRYSTALLINE; TEMPERATURE REGIONS; TRAP DENSITY; VARIABLE RANGE HOPPING;

EID: 79958220465     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2011.05.001     Document Type: Article
Times cited : (10)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.