Structural and optical properties of AgIn5S8 films prepared by pulsed laser deposition

Thin Solid Films

Volumn 487, Issue 1-2, 2005, Pages 31-34

  Bodnar, I V ^a   Gremenok, V F ^b  

^a BELARUSIAN STATE UNIVERSITY OF INFORMATICS AND RADIOELECTRONICS   (Belarus)

^b INSTITUTE OF SOLID STATE AND SEMICONDUCTOR PHYSICS   (Belarus)

Author keywords

Composition; Depositon process; Thin Film; X ray diffraction

Indexed keywords

CRYSTAL LATTICES; FILM GROWTH; OPTICAL PROPERTIES; PULSED LASER DEPOSITION; SUBSTRATES; X RAY DIFFRACTION;

CRYSTALLINE SUBLATTICE; DEPOSITION PROCESS; LASER-DEPOSITED FILMS; TRANSITION ENERGY;

THIN FILMS;

EID: 22944435796     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.01.030     Document Type: Conference Paper

References (8)

1. J.L. Shay, and J.H. Wernick Ternary chalcopyrite semiconductors: Growth, electronic properties and applications 1975 Pergamon Press New York
2. L. Kazmerski Renew. Sustain. Energy Rev. 1 1997 71
3. U. Rau, and H.W. Shock Ser. Photoconversion Sol. Energy 1 2001 277
4. A.N. Tiwari, S. Blunier, M. Filzmoser, H. Zogg, D. Schmid, and H.W. Schock Appl. Phys. Lett. 65 1994 3347
5. K. Wakamura, S. Endo, and T. Irie Cryst. Res. Technol. 31 1996 923
6. R. Schaffler, M. Klose, M. Brieger, H. Dittrich, and H.W. Schock Mat. Sci. Forum 173/174 1995 135
7. V.F. Gremenok, I.A. Victorov, A.E. Hill, and R.D. Tomlinson Mater. Lett. 35 1998 130
8. L.C. Feldman, J.W. Mayer, Fundamentals of Surface and Thin Film Analysis, North-Holland, 1986.