Annealing effects on the structural and optical properties of AgIn5S8 thin films

Journal of Alloys and Compounds

Volumn 455, Issue 1-2, 2008, Pages 295-297

  Qasrawi, A F ^a  

^a ATILIM UNIVERSITY   (Turkey)

Author keywords

Optical properties; Semiconductors; Thin films; Vapour deposition; X ray diffraction

Indexed keywords

ALUMINUM ALLOYS; MOS DEVICES; OPTICAL PROPERTIES; SEMICONDUCTOR MATERIALS; VAPOR DEPOSITION; X RAY DIFFRACTION ANALYSIS;

OPTICAL ENERGY BAND GAP; THERMALLY ANNEALED FILMS;

THIN FILMS;

EID: 41049097511     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2007.01.030     Document Type: Article

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