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Volumn 7638, Issue , 2010, Pages
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Evaluating SEM performance from the contrast transfer function
a,b c a,d |
Author keywords
Fourier analysis; metrology; resolution; SEM; signal to noise
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Indexed keywords
CONTRAST TRANSFER FUNCTION;
DIAGNOSTIC CAPABILITIES;
FOURIER SPECTRA;
IMAGING CAPABILITIES;
IMAGING PERFORMANCE;
NOISE LEVELS;
PUBLIC DOMAIN SOFTWARES;
SCANNING ELECTRON MICROSCOPES;
SIGNAL COMPONENTS;
SIGNAL TO NOISE;
SPATIAL FREQUENCY;
SPATIAL RESOLUTION;
STANDARD PRACTICES;
TRANSMISSION ELECTRON MICROSCOPE;
ELECTRON MICROSCOPES;
FOURIER ANALYSIS;
MEASUREMENTS;
PROCESS CONTROL;
SCANNING ELECTRON MICROSCOPY;
TRANSMISSION ELECTRON MICROSCOPY;
UNITS OF MEASUREMENT;
TRANSFER FUNCTIONS;
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EID: 79958021849
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.846455 Document Type: Conference Paper |
Times cited : (15)
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References (6)
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