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Volumn 7638, Issue , 2010, Pages

Evaluating SEM performance from the contrast transfer function

Author keywords

Fourier analysis; metrology; resolution; SEM; signal to noise

Indexed keywords

CONTRAST TRANSFER FUNCTION; DIAGNOSTIC CAPABILITIES; FOURIER SPECTRA; IMAGING CAPABILITIES; IMAGING PERFORMANCE; NOISE LEVELS; PUBLIC DOMAIN SOFTWARES; SCANNING ELECTRON MICROSCOPES; SIGNAL COMPONENTS; SIGNAL TO NOISE; SPATIAL FREQUENCY; SPATIAL RESOLUTION; STANDARD PRACTICES; TRANSMISSION ELECTRON MICROSCOPE;

EID: 79958021849     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.846455     Document Type: Conference Paper
Times cited : (15)

References (6)
  • 1
    • 0042090709 scopus 로고    scopus 로고
    • Experimental resolution measurement in critical dimension scanning electron microscope metrology
    • Lorusso G F and Joy D C, "Experimental resolution measurement in critical dimension scanning electron microscope metrology", SCANNING 25, 175-180 (2003)
    • (2003) Scanning , vol.25 , pp. 175-180
    • Lorusso, G.F.1    Joy, D.C.2
  • 2
    • 0011739263 scopus 로고    scopus 로고
    • A contribution to the evaluation of SEM resolution
    • Maunly, A. & Fanget, G.L. (1999) A contribution to the evaluation of SEM resolution. SPIE Proc. Microlithogr. 3332, 71-80.
    • (1999) SPIE Proc. Microlithogr. , vol.3332 , pp. 71-80
    • Maunly, A.1    Fanget, G.L.2
  • 3
    • 33745584333 scopus 로고    scopus 로고
    • Tools to measure CD-SEM performance
    • Metrology, Inspection and Process Control for MicroLithography XX, ed Chas. N. Archie
    • Kim J, Jalhadi K, Deo S, Lee S-Y, and Joy DC, "Tools to measure CD-SEM performance", in Metrology, Inspection and Process Control for MicroLithography XX, ed Chas. N. Archie, Proc. of SPIE 6152, OT1 - OT9, (2006),
    • (2006) Proc. of SPIE , vol.6152
    • Kim, J.1    Jalhadi, K.2    Deo, S.3    Lee, S.-Y.4    Joy, D.C.5
  • 5
    • 0036437068 scopus 로고    scopus 로고
    • SMART - A program to measure SEM resolution and imaging performance
    • Joy D C, "SMART - a program to measure SEM resolution and imaging performance", J. of Microscopy, 208, 24-34, (2002)
    • (2002) J. of Microscopy , vol.208 , pp. 24-34
    • Joy, D.C.1
  • 6
    • 79958040265 scopus 로고    scopus 로고
    • IMAGE Java is a public domain program, written by Wayne Rasband (NIH). The most current build can be downloaded from The SMART-J plug-in is available free from David Joy (djoy@utk.edu)
    • IMAGE Java is a public domain program, written by Wayne Rasband (NIH). The most current build can be downloaded from http://rsb.ifo.nih.gov/ij/ The SMART-J plug-in is available free from David Joy (djoy@utk.edu)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.