Electric-field sensing using single diamond spins

Nature Physics

Volumn 7, Issue 6, 2011, Pages 459-463

  Dolde, F ^a   Fedder, H ^a   Doherty, M W ^b   Nobauer T ^c   Rempp, F ^a   Balasubramanian, G ^a   Wolf, T ^a   Reinhard, F ^a   Hollenberg, L C L ^b   Jelezko, F ^a   Wrachtrup, J ^a  

^a UNIVERSITY OF STUTTGART   (Germany)

^b UNIVERSITY OF MELBOURNE   (Australia)

^c TU WIEN   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; DIAMONDS; ELECTRIC FIELD MEASUREMENT; ELECTRIC FIELDS; ELECTRIC FORCE MICROSCOPY; ELECTRONIC STRUCTURE; ELECTROSTATIC FORCE; MAGNETIC FIELDS; NANOMAGNETICS; SCANNING TUNNELING MICROSCOPY; TEMPERATURE;

APPLIED MAGNETIC FIELDS; ELECTRIC AND MAGNETIC FIELDS; ELECTRIC FIELD SENSING; ELECTROSTATIC FORCE MICROSCOPY; LOW TEMPERATURE METHOD; MAGNETIC AND ELECTRIC FIELDS; NANOSCALE DETECTION; SENSING APPLICATIONS;

SINGLE ELECTRON TRANSISTORS;

EID: 79958003750     PISSN: 17452473     EISSN: 17452481     Source Type: Journal    
DOI: 10.1038/nphys1969     Document Type: Article

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