Thermal energy loss mechanisms in micro- to nano-scale devices

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8031, Issue , 2011, Pages

  Duwel, A E ^a   Lozow, Jeff ^a   Fisher, Christopher J ^a   Phillips, Terese ^a   Olsson, Roy H ^b   Weinberg, Marc ^a  

^a CHARLES STARK DRAPER LABORATORY   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

Akhieser; BAW; Damping; Gruneisen; Landau Rumer; Q; Quality Factor; Resonator; Thermoelastic

Indexed keywords

AKHIESER; BAW; GRUNEISEN; LANDAU-RUMER; Q; QUALITY FACTOR; THERMOELASTICS;

DAMPING; ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY DISSIPATION; NANOSTRUCTURED MATERIALS; RESONATORS; THERMOELASTICITY;

NANOSENSORS;

EID: 79957970856     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.885130     Document Type: Conference Paper

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