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Volumn 16, Issue 3-4, 2003, Pages 586-590
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Technological aspects of oxidated porous silicon waveguides
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Author keywords
Epitaxy; Optoelectronics; Porous silicon; Swirl defects; Waveguides
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Indexed keywords
DEFECTS;
OPTOELECTRONIC DEVICES;
OXIDATION;
POROUS SILICON;
OPTICAL LOSSES;
WAVEGUIDES;
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EID: 0037370347
PISSN: 13869477
EISSN: None
Source Type: Journal
DOI: 10.1016/S1386-9477(02)00687-2 Document Type: Conference Paper |
Times cited : (8)
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References (7)
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