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Volumn 7969, Issue , 2011, Pages

EUVL alternating phase shift mask

Author keywords

EUVL Alternating phase shift mask (EUVL APSM). Phase error; EUVL mask; EUVL multilayer; Extreme ultra violet lithography (EUVL)

Indexed keywords

ALTERNATING PHASE SHIFT MASKS; APSM MASKS; BINARY MASKS; BINARY STRUCTURES; DATA ANALYSIS; DEPTH OF FOCUS; EUVL MASK; EUVL MULTILAYER; EXTREME ULTRA-VIOLET LITHOGRAPHY (EUVL); EXTREME ULTRAVIOLETS; IMBALANCE COMPENSATION; LINEWIDTH ROUGHNESS; MASK DESIGN; MASK FABRICATION; OFF-AXIS ILLUMINATION; OPTICAL ENHANCEMENTS; PHASE DIFFERENCE; PHASE ERROR; PHASE GENERATION; PHASE MISMATCH; PHASE REGION; PHASE STEPS; PROCESS CONDITION; RESIST RESOLUTION; RESOLUTION IMPROVEMENT; STEP HEIGHT; WAFER LEVEL;

EID: 79957955165     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.884790     Document Type: Conference Paper
Times cited : (8)

References (8)
  • 2
    • 0037627551 scopus 로고    scopus 로고
    • EUVL Alternating Phase Shift Mask Imaging Evaluation
    • P. Y. Yan, "EUVL Alternating Phase Shift Mask Imaging Evaluation," Proc. SPIE 4889, 1099 (2002).
    • (2002) Proc. SPIE , vol.4889 , pp. 1099
    • Yan, P.Y.1
  • 3
    • 0041361760 scopus 로고    scopus 로고
    • Alternating Phase Shift Mask in Extreme Ultra Violet Lithography
    • M. Sugawara, A. Chiba, H. Yamanashi, and I. Nishiyama, "Alternating Phase Shift Mask in Extreme Ultra Violet Lithography," Jpn. J. Appl. Phys. Vol 42, 3776 (2003).
    • (2003) Jpn. J. Appl. Phys. , vol.42 , pp. 3776
    • Sugawara, M.1    Chiba, A.2    Yamanashi, H.3    Nishiyama, I.4
  • 4
    • 0038719133 scopus 로고    scopus 로고
    • Design of Phase Shift Masks in Extreme Ultraviolet Lithography
    • M. Sugawara, A. Chiba, and I. Nishiyama, "Design of Phase Shift Masks in Extreme Ultraviolet Lithography," Jpn. J. Appl. Phys. 42, 2639 (2003).
    • (2003) Jpn. J. Appl. Phys. , vol.42 , pp. 2639
    • Sugawara, M.1    Chiba, A.2    Nishiyama, I.3
  • 5
    • 0033332216 scopus 로고    scopus 로고
    • Through-Focus Image Balancing of Alternating Phase Shifting Masks
    • S. Peng, "Through-Focus Image Balancing of Alternating Phase Shifting Masks," Proc. SPIE 3873, 328 (1999).
    • (1999) Proc. SPIE , vol.3873 , pp. 328
    • Peng, S.1
  • 6
    • 0033319605 scopus 로고    scopus 로고
    • Proximity Effects of Alternating Phase Shift Masks
    • W. Maurer, C. Friedrich, L. Mader, and J. Thiele, "Proximity Effects of Alternating Phase Shift Masks." Proc. SPIE 3873, 328 (1999).
    • (1999) Proc. SPIE , vol.3873 , pp. 328
    • Maurer, W.1    Friedrich, C.2    Mader, L.3    Thiele, J.4
  • 7
    • 0038126660 scopus 로고    scopus 로고
    • Transmission and Phase Balancing of Alternating Phase Shift Masks (5X) - Theoretical and Experimental Results
    • U. A. Griesinger, R. Pforr, J. Knobloch, and C. Friedrich, "Transmission and Phase Balancing of Alternating Phase Shift Masks (5X) - Theoretical and Experimental Results," Proc. SPIE 3873, 328 (1999).
    • (1999) Proc. SPIE , vol.3873 , pp. 328
    • Griesinger, U.A.1    Pforr, R.2    Knobloch, J.3    Friedrich, C.4
  • 8
    • 0025893478 scopus 로고
    • Chromeless Phase-Shift Masks: A New Approach to Phase Shifting Masks
    • K. Toh, G. Dao, R, Singh, and H. Gaw, "Chromeless Phase-Shift Masks: A New Approach to Phase Shifting Masks," Proc. SPIE 1496, 27 (1990).
    • (1990) Proc. SPIE , vol.1496 , pp. 27
    • Toh, K.1    Dao, G.2    Singh, R.3    Gaw, H.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.