|
Volumn 7969, Issue , 2011, Pages
|
EUVL alternating phase shift mask
a a a a a b b |
Author keywords
EUVL Alternating phase shift mask (EUVL APSM). Phase error; EUVL mask; EUVL multilayer; Extreme ultra violet lithography (EUVL)
|
Indexed keywords
ALTERNATING PHASE SHIFT MASKS;
APSM MASKS;
BINARY MASKS;
BINARY STRUCTURES;
DATA ANALYSIS;
DEPTH OF FOCUS;
EUVL MASK;
EUVL MULTILAYER;
EXTREME ULTRA-VIOLET LITHOGRAPHY (EUVL);
EXTREME ULTRAVIOLETS;
IMBALANCE COMPENSATION;
LINEWIDTH ROUGHNESS;
MASK DESIGN;
MASK FABRICATION;
OFF-AXIS ILLUMINATION;
OPTICAL ENHANCEMENTS;
PHASE DIFFERENCE;
PHASE ERROR;
PHASE GENERATION;
PHASE MISMATCH;
PHASE REGION;
PHASE STEPS;
PROCESS CONDITION;
RESIST RESOLUTION;
RESOLUTION IMPROVEMENT;
STEP HEIGHT;
WAFER LEVEL;
DATA REDUCTION;
EXPERIMENTS;
EXTREME ULTRAVIOLET LITHOGRAPHY;
FABRICATION;
MULTILAYERS;
PHASE SHIFT;
ROUGHNESS MEASUREMENT;
MASKS;
|
EID: 79957955165
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.884790 Document Type: Conference Paper |
Times cited : (8)
|
References (8)
|