Ferroelectric nanostructures fabricated by focused-ion-beam milling in epitaxial BiFeO3 thin films

Nanotechnology

Volumn 22, Issue 26, 2011, Pages

  Morelli, A ^a   Johann, F ^a   Schammelt, N ^a   Vrejoiu, I ^a  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING PROCEDURES; BISMUTH FERRITES; COMBINED VACUUM; EPITAXIAL THIN FILMS; FERROELECTRIC NANOSTRUCTURES; MILLING PROCESS; OXYGEN ATMOSPHERE; PIEZORESPONSE FORCE MICROSCOPY; POLARIZATION DIRECTION;

BISMUTH; COMMINUTION; EPITAXIAL GROWTH; FERRITES; FERROELECTRICITY; ION BEAMS; IONS; THIN FILMS;

MILLING (MACHINING);

EID: 79957844232     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/22/26/265303     Document Type: Article

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