X-ray absorption spectroscopy of mass-selected transition metal clusters using a cyclotron ion trap: An experimental setup for measuring XMCD spectra of free clusters

Journal of Electron Spectroscopy and Related Phenomena

Volumn 184, Issue 3-6, 2011, Pages 113-118

  Peredkov, Sergey ^a,b   Savci, Ali ^b   Peters, Sven ^b   Neeb, Matthias ^b   Eberhardt, Wolfgang ^b   Kampschulte, Heinrich ^c   Meyer, Jennifer ^c   Tombers, Matthias ^c   Hofferberth, Bernd ^c,d   Menges, Fabian ^c   Niedner Schatteburg, Gereon ^c  

^a TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

^b HAHN MEITNER INSTITUT   (Germany)

^c Rheinland Pfälzische Technische Universität Kaiserslautern Landau   (Germany)

^d UNIVERSITY OF KONSTANZ   (Germany)

Author keywords

ICR ion trapping; Mass spectrometry; Transition metal cluster; X ray absorption spectroscopy; XMCD

Indexed keywords

AUGER DECAYS; CLUSTER IONS; EXPERIMENTAL SETUP; FRAGMENTATION PATTERNS; FREE CLUSTERS; ION TRAPPING; ION TRAPS; MAGNETIC CIRCULAR DICHROISM SPECTRA; MASS-SELECTED CLUSTERS; PHOTOABSORPTIONS; PHOTON ENERGY RANGE; QUANTITATIVE DETERMINATIONS; SOFT-X-RAY ABSORPTION; TRANSITION METAL CLUSTER; TRANSITION-METAL CLUSTERS; X-RAY ABSORPTION SPECTRUM; XMCD;

ABSORPTION; CYCLOTRONS; DICHROISM; IONS; MASS SPECTROMETRY; NIOBIUM; SPECTROMETERS; TRANSITION METAL COMPOUNDS; TRANSITION METALS; X RAY ABSORPTION; X RAY ABSORPTION SPECTROSCOPY; X RAYS;

ABSORPTION SPECTROSCOPY;

EID: 79957584629     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2010.12.031     Document Type: Article

References (39)

1. L.H. Tjeng, Y.U. Idzerda, P. Rudolf, F. Sette, and C.T. Chen J. Magn. Magn. Mater. 109 1992 288
2. P. Gambardella, A. Dallmeyer, K. Maiti, M.C. Malagoli, W. Eberhardt, K. Kern, and C. Carbone Nature 416 2002 301
3. M. Getzlaff, A. Kleibert, R. Methling, J. Bansmann, and K.-H. Meiwes-Broer Surf. Sci. 566 2004 332
4. J.T. Lau, A. Foehlisch, R. Nietubyc, M. Reif, and W. Wurth Phys. Rev. Lett. 89 2002 57202
5. K. Fauth, M. Heßler, D. Batchelor, and G. Schütz Surf. Sci. 529 2003 397
6. G. Schütz, W. Wagner, W. Wilhelm, P. Kienle, R. Zeller, R. Frahm, and G. Materlik Phys. Rev. Lett. 58 1987 737
7. J. Stöhr J. Electron Spectrosc. Relat. Phenom. 75 1995 253
8. O. Sipr, J. Minar, and H. Ebert Eur. Phys. Lett. 87 2009 67007
9. C. Van Wüllen J. Chem. Phys. 130 2009 194109
10. C. Van Wüllen J. Phys. Chem. A 113 2009 11535
11. I.M.L. Billas, A. Chatelain, and W.A. de Heer Science 265 1994 1682
12. X. Xu, S. Yin, R. Moro, and W.A. de Heer Phys. Rev. Lett. 95 2005 237209
13. M.B. Knickelbein J. Chem. Phys. 125 2006 044308
14. F.W. Payne, W. Jiang, J.W. Emmert, J. Deng, and L.A. Bloomfield Phys. Rev. B 75 2007 094431
15. C. Walther, St. Becker, G. Dietrich, H.-J. Kluge, M. Lindinger, K. Lützenkirchen, L. Schweikhard, and J. Ziegler Z. Phys. D 38 1996 51
16. S. Krückeberg, P. Beiersdorfer, G. Dietrich, K. Lützenkirchen, L. Schweikhard, and C. Walther Rapid Commun. Mass Spectrosc. 11 1997 45
17. B.M. Reinhard, A. Lagutschenkov, J. Lemaire, P. Boissel, P. Maitre, and G. Niedner-Schatteburg J. Phys. Chem. A 108 2004 3350
18. S. Krückeberg, D. Schooss, M. Maier-Borst, and J.H. Parks Phys. Rev. Lett. 85 2000 4494
19. M. Grimm, B. Langer, S. Schlemmer, T. Lischke, U. Becker, W. Widdra, D. Gerlich, R. Flesch, and E. Rühl Phys. Rev. Lett. 96 2006 066801
20. J.T. Lau, J. Rittmann, V. Zamudio-Bayer, R. Richter, M. Vogel, K. Hirsch, Ph. Klar, F. Lofink, T. Moeller, and B.V. Issendorff Phys. Rev. Lett. 101 2008 153401
21. J.J. Yeh, and I. Lindau Atom. Data Nucl. Data Tables 32 1985 1 155
22. H.G. Jürgen Mass Spectrometry: A Textbook 2004 Springer Verlag Berlin, Heidelberg, New York
23. W. Eberhardt, J. Stöhr, J. Feldhaus, E.W. Plummer, and F. Sette Phys. Rev. Lett. 51 1983 2370
24. B. Pfeffer, S. Jaberg, and G. Niedner-Schatteburg J. Chem. Phys. 131 2009 194305
25. P. Caravatti, and M. Allemann Org. Mass Spectrom. 26 1991 514
26. A.G. Marshall, and P.B. Grosshans Anal. Chem. 63 1991 215A
27. D.A. Dahl SIMION 3D Version 6.0, Users' Manual Publication No. INEL-95/0403 1995 Lockheed Idaho Technologies Company Idaho Falls, ID, USA
28. D.A. Dahl, T.R. McJunkin, and J.R. Scott Intl. J. Mass Spectrom. 266 2007 156
29. J.T. Lau, K. Hirsch, Ph. Klar, A. Langenberg, F. Lofink, R. Richter, J. Rittmann, M. Vogel, V. Zamudio-Bayer, T. Moeller, and B.V. Issendorff Phys. Rev. A 79 2009 053201
30. M. Seidl, and J.P. Perdew Phys. Rev. B 50 1994 5744
31. A. Pramann, K. Koyasu, A. Nakajima, and K. Kaya J. Phys. Chem. A 106 2002 2483
32. M. Martins, K. Godehusen, T. Richter, P. Wernet, and P. Zimmermann J. Phys. B 39 2006 R79
33. V. Ilakovac, M. Kralj, P. Pervan, M.C. Richter, A. Goldoni, R. Larciprete, L. Petaccia, and K. Hricovini1 Phys. Rev. B 71 2005 085413
34. http://environmentalchemistry.com/yogi/periodic/V.html#Physical.
35. R.D. Leapman, P. Rez, and D.F. Mayers J. Chem. Phys. 72 1979 1232
36. M.J. Olszta, J. Wang, and E.C. Dickey J. Microsc. 224 2006 233
37. FEFF 8 program package S.I. Zabinsky, J.J. Rehr, A. Ankudinov, R.C. Albers, and M.J. Eller Phys. Rev. B 52 1995 2995
38. H. Kampschulte, PhD thesis, "Entwicklung einer Tieftemperatur FT-ICR Zelle und Charakterisierung mittels Reaktionskinetiken und Synchrotron- Spektroskopie", TU Kaiserslautern, 2011.
39. C.T. Chen, Y.U. Idzerda, H.-J. Lin, N.V. Smith, G. Meigs, E. Chaban, G.H. Ho, E. Pellegrin, and F. Sette Phys. Rev. Lett. 75 1995 152