Stoichiometry and valence measurements of niobium oxides using electron energy-loss spectroscopy

Journal of Microscopy

Volumn 224, Issue 3, 2006, Pages 233-241

  Olszta, M J ^a   Wang, J ^a   Dickey, E C ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

Analytical electron microscopy; Electron energy loss spectroscopy; Energy loss near edge structure; M2,3; Nb 2O5; NbO; NbO2; Niobium; Niobium oxide; Transmission electron microscopy; White line

Indexed keywords

DISSOCIATION; ELECTRON EMISSION; ELECTRON ENERGY LEVELS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; ELECTRONS; ENERGY DISSIPATION; METAL ANALYSIS; NIOBIUM OXIDE; SPECTRUM ANALYSIS; STOICHIOMETRY; TRANSITION METALS;

ANALYTICAL ELECTRON MICROSCOPY; ELECTRON ENERGY-LOSS SPECTROSCOPIES; ENERGY LOSS NEAR EDGE STRUCTURE; INTEGRATION WINDOW; K FACTOR; M2,3; MEASUREMENTS OF; NB 2O5; O K-EDGES; WHITE LINES;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

METAL ION; NIOBIUM;

ARTICLE; ELECTRON ENERGY LOSS SPECTROSCOPY; ERROR; FACTORIAL ANALYSIS; IONIZATION; PRIORITY JOURNAL; QUALITATIVE ANALYSIS; QUANTITATIVE ANALYSIS; STOICHIOMETRY;

EID: 33845804737     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2006.01709.x     Document Type: Article

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