An endurance-enhanced flash translation layer via reuse for NAND flash memory storage systems

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2011, Pages 14-19

  Wang, Yi ^a   Liu, Duo ^a   Qin, Zhiwei ^a   Shao, Zili ^a  

^a HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC; DATA BLOCKS; FLASH TRANSLATION LAYER; HIGH CELL DENSITY; I/O TRACES; LOG BLOCKS; MERGE OPERATIONS; NAND FLASH MEMORY; NONVOLATILITY; REUSE STRATEGY; SHOCK RESISTANCE; WINDOWS SYSTEM;

DURABILITY; EMBEDDED SYSTEMS; NAND CIRCUITS;

FLASH MEMORY;

EID: 79957578221     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)

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