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Volumn 6, Issue 2, 2011, Pages 767-778
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Researches regarding the microanalysis results optimisation on multilayer nanostructures investigations
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Author keywords
Depth of X ray excitation; Electron beam; Microanalysis; Multilayer nanostructures
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Indexed keywords
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EID: 79957510960
PISSN: None
EISSN: 18423582
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (9)
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References (14)
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