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Volumn 6, Issue 2, 2011, Pages 767-778

Researches regarding the microanalysis results optimisation on multilayer nanostructures investigations

Author keywords

Depth of X ray excitation; Electron beam; Microanalysis; Multilayer nanostructures

Indexed keywords


EID: 79957510960     PISSN: None     EISSN: 18423582     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (9)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.