Electron impinging on metallic thin film targets

Applied Surface Science

Volumn 256, Issue 11, 2010, Pages 3448-3452

  Rouabah, Z ^a,b   Bouarissa, N ^c   Champion, C ^a  

^a UNIVERSITY OF LIÈGE   (Belgium)

^b UNIVERSITY OF BORDJ BOU ARRERIDJ   (Algeria)

^c KING KHALID UNIVERSITY   (Saudi Arabia)

Author keywords

Electron scattering; Nanometric scale; Thin films; Transport cross sections

Indexed keywords

BACKSCATTERING; ELECTRON SCATTERING; ELECTRON TRANSPORT PROPERTIES; INTELLIGENT SYSTEMS; MONTE CARLO METHODS;

ANALYTICAL EXPRESSIONS; BACKSCATTERING COEFFICIENTS; CU THIN FILM; ELECTRON TRANSPORT; METALLIC THIN FILMS; NANOMETRIC SCALE; TRANSPORT CROSS-SECTION;

THIN FILMS;

EID: 77649337968     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2009.12.051     Document Type: Article

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