Submicron extreme ultraviolet imaging using high-harmonic radiation

Applied Physics Letters

Volumn 81, Issue 14, 2002, Pages 2520-2522

  Wieland, Marek ^a   Frueke, Rolf ^a   Wilhein, Thomas ^a   Spielmann, Christian ^b,c   Pohl, Martin ^d   Kleineberg, Ulf ^d  

^a UNIVERSITY OF APPLIED SCIENCES   (Germany)

^b VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^c UNIVERSITY OF WÜRZBURG   (Germany)

^d BIELEFELD UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BACK-ILLUMINATED CCD; EXTREME ULTRAVIOLET IMAGING; MICROSCOPY IMAGING; SPATIAL RESOLUTION; SUBMICRON; ZONE PLATES;

PHYSICAL PROPERTIES; PHYSICS;

MICA;

EID: 79956019666     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1511288     Document Type: Article

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