Transient photoinduced diffractive solid immersion lens for infrared microscopy

Applied Physics Letters

Volumn 81, Issue 19, 2002, Pages 3678-3680

  Cohn, K ^a   Simanovskii, D ^a   Smith, T ^a   Palanker, D ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FOCUSING PROPERTIES; HIGH INDEX; HIGH NUMERICAL APERTURES; INFRARED MICROSCOPY; MECHANICAL SCANNING; NEAR FIELD PROBES; NEAR-FIELD; PHOTO-INDUCED; SEMI-CONDUCTOR WAFER; SOLID IMMERSION LENS; ZONE PLATES;

GALLIUM PHOSPHIDE; OPTICAL DATA STORAGE; OPTICAL WAVEGUIDES; PLATES (STRUCTURAL COMPONENTS); REFRACTION; SAFETY ENGINEERING; SCANNING; SEMICONDUCTING SILICON COMPOUNDS;

SILICON WAFERS;

EID: 79956017392     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1519729     Document Type: Article

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