All YBa2Cu3O7-δ trilayer junctions with YBa2Cu3O7-δ wiring layers

Applied Physics Letters

Volumn 80, Issue 21, 2002, Pages 3985-3987

  Fujimoto, E ^a   Sato, H ^a   Yamada, T ^a   Akoh, H ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BARRIER THICKNESS; CRITICAL TEMPERATURES; FRAUNHOFER; GRAIN BOUNDARY JUNCTIONS; INSULATING LAYERS; INTERFERENCE PATTERNS; IV CHARACTERISTICS; JOSEPHSON; JUNCTION SIZE; MAGNETIC FIELD DEPENDENCES; MGO SUBSTRATE; MODULATION PERIOD; TRILAYER STRUCTURE; TRILAYERS;

PHYSICAL PROPERTIES; PHYSICS;

MAGNETIC FIELDS;

EID: 79955994596     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1481765     Document Type: Article

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