Control of the confining potential in ballistic constrictions using a persistent charging effect

Applied Physics Letters

Volumn 81, Issue 15, 2002, Pages 2779-2781

  Fischer, S F ^a   Apetrii, G ^a   Skaberna, S ^a   Kunze, U ^a   Reuter, D ^a   Wieck, A D ^a  

^a RUHR UNIVERSITY BOCHUM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPE LITHOGRAPHY; CHARGING EFFECT; COOLING BIAS; DRAIN VOLTAGE; FORWARD BIAS VOLTAGE; GAAS/ALGAAS; GATE ELECTRODES; GATE VOLTAGES; LATERAL CONFINEMENT POTENTIAL; PARTIAL NEUTRALIZATION; QUANTIZED CONDUCTANCE; QUANTUM POINT CONTACT; SAMPLE COOLING; SUB-BANDS;

ATOMIC FORCE MICROSCOPY; BALLISTICS; LITHOGRAPHY; POINT CONTACTS; QUANTUM CHEMISTRY; QUANTUM CONFINEMENT; QUANTUM ELECTRONICS; WET ETCHING;

BIAS VOLTAGE;

EID: 79955987340     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1511278     Document Type: Article

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