3-D x-ray Strain microscopy in two-phase composites at submicron length scales

JOM

Volumn 63, Issue 3, 2011, Pages 30-34

  Barabash, R I ^a,b   Bei, H ^a   Ice, G E ^a   Gao, Y F ^a,b   Barabash, O M ^a,b  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b University of Tennessee   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONSTITUENT PHASIS; INTERFACE STRENGTH; KEY ELEMENTS; MICRO-MECHANICAL; MICROMECHANISMS; NEAR-SURFACE STRESS; RESIDUAL STRAINS; SLIP ZONES; SUBMICRON; SUBMICRON LENGTH; TWO PHASE COMPOSITES; X RAY MICRODIFFRACTION;

STRAIN; STRESS ANALYSIS; X RAY DIFFRACTION;

PHASE INTERFACES;

EID: 79955790779     PISSN: 10474838     EISSN: 15431851     Source Type: Journal    
DOI: 10.1007/s11837-011-0042-1     Document Type: Article

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