Effects of focused ion beam milling and pre-straining on the microstructure of directionally solidified molybdenum pillars: A Laue diffraction analysis

Scripta Materialia

Volumn 62, Issue 10, 2010, Pages 746-749

  Zimmermann, J ^a   Van Petegem, S ^a   Bei, H ^b   Grolimund, D ^a   George, E P ^b   Van Swygenhoven, H ^a  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Directional solidification; Focused ion beam; Micropillars; Single crystal; X ray diffraction

Indexed keywords

AS-GROWN; DIRECTIONAL SOLIDIFICATION; DIRECTIONALLY SOLIDIFIED; FIB MILLING; FOCUSED ION BEAM MILLING; LAUE DIFFRACTION; MICRO-PILLARS; PERFECT CRYSTALS; SINGLE CRYSTAL X-RAY DIFFRACTION; SINGLE-CRYSTAL SI; WHITE BEAMS;

BEAM PLASMA INTERACTIONS; CRYSTALLIZATION; DIFFRACTION; FOCUSED ION BEAMS; ION BOMBARDMENT; IONS; MILLING (MACHINING); MOLYBDENUM; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS; SOLIDIFICATION; X RAY DIFFRACTION;

CRYSTAL STRUCTURE;

EID: 77649271286     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2010.02.013     Document Type: Article

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