Residual stress-dependent electric conductivity of sputtered co-doped CeO2 thin-film electrolyte

Journal of Applied Physics

Volumn 109, Issue 8, 2011, Pages

  Liu, Wei ^a   Liu, Hongqin ^a   Ou, Gang ^a   Pan, Wei ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALED FILMS; AS ANNEALING; AS-DEPOSITED FILMS; CO-DOPED; IN-PLANE; POLYCRYSTALLINE ALUMINA; RF-MAGNETRON SPUTTERING; ROOM TEMPERATURE; STRESS-DEPENDENT; THIN FILM ELECTROLYTES;

ANNEALING; CERIUM COMPOUNDS; ELECTRIC CONDUCTIVITY; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTROLYTES; MAGNETRON SPUTTERING; RESIDUAL STRESSES;

ACTIVATION ENERGY;

EID: 79955724834     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3573669     Document Type: Article

References (22)

1. B. Zhu, J. Power Sources 114, 1 (2003). 10.1016/S0378-7753(02)00592-X (Pubitemid 41325530)
2. A. C. Johnson, B. K. Lai, H. Xiong, and S. Ramanathan, J. Power Sources 186, 252 (2009). 10.1016/j.jpowsour.2008.10.021
3. Y. Y. Liu, B. Li, X. Wei, and W. Pan, J. Am. Ceram. Soc. 91, 3926 (2008). 10.1111/j.1551-2916.2008.02748.x
4. D. J. Kim, J. Am. Ceram. Soc. 72, 1415 (1989). 10.1111/j.1151-2916.1989. tb07663.x
5. F. Y. Wang, S. Chen, and S. Cheng, Electrochem. Commun. 6, 743 (2004). 10.1016/j.elecom.2004.05.017
6. S. Omar, E. D. Wachsman, and J. C. Nino, Appl. Phys. Lett. 91, 144106 (2007). 10.1063/1.2794725 (Pubitemid 47531592)
7. D. A. Andersson, S. I. Simak, N. V. Skorodumova, I. A. Abrikosov, and B. Johansson, Proc. Natl. Acad. Sci. U.S.A. 103, 3518 (2006). 10.1073/pnas. 0509537103 (Pubitemid 43376587)
8. S. J. Litzelman, J. L. Hertz, W. Jung, and H. L. Tuller, Fuel Cells 8, 294 (2008). 10.1002/fuce.200800034
9. D. Beckel, A. Bieberle-Htter, A. Harvey, A. Infortuna, U. P. Muecke, M. Prestat, J. L. M. Rupp, and L. J. Gauckler, J. Power Sources 173, 325 (2007). 10.1016/j.jpowsour.2007.04.070 (Pubitemid 47498839)
10. R. P. Wang, S. H. Pan, and Y. L. Zhou, Solid State Commun. 114, 613 (2000). 10.1016/S0038-1098(00)00072-7
11. S. Y. Chuna and N. Mizutani, Appl. Surf. Sci. 171, 82 (2001). 10.1016/S0169-4332(00)00543-2 (Pubitemid 32092597)
12. N. Schichtel, C. Korte, D. Hesseb, and J. Janek, Phys. Chem. Chem. Phys. 11, 3043 (2009). 10.1039/b900148d
13. J. Xiong, W. F. Qin, X. M. Cui, B. W. Tao, J. L. Tang, and Y. R. Li, Physica C 442, 124 (2006). 10.1016/j.physc.2006.05.024 (Pubitemid 43983055)
14. R. P. Wang, S. H. Pan, and Y. L. Zhou, Solid State Commun. 114, 613 (2000). 10.1016/S0038-1098(00)00072-7
15. J. L. M. Rupp and L. J. Gauckler, Solid State Ionics 177, 2513 (2006). 10.1016/j.ssi.2006.07.033 (Pubitemid 44634120)
16. I. E. L. Stephens and J. A. Kilner, Solid State Ionics 177, 669 (2006). 10.1016/j.ssi.2006.01.010
17. A. Peters, C. Korte, D. Hesse, N. Zakharov, and J. Janek, Solid State Ionics 178, 67 (2007). 10.1016/j.ssi.2006.12.004 (Pubitemid 46123607)
18. I. Kosacki, C. M. Rouleau, P. F. Becher, J. Bentley, and D. H. Lowndes, Solid State Ionics 176, 1319 (2005). 10.1016/j.ssi.2005.02.021
19. K. Huang and H. D. Harter, Solid State Ionics 181, 943 (2010). 10.1016/j.ssi.2010.05.008
20. Y. F. Li, B. Yao, Y. M. Lu, C. X. Cong, Z. Z. Zhang, Y. Q. Gai, C. J. Zheng, B. H. Li, Z. P. Wei, D. Z. Shen, X. W. Fan, L. Xiao, S. C. Xu, and Y. Liu, Appl. Phys. Lett. 91, 021915 (2007). 10.1063/1.2757149 (Pubitemid 47114726)
21. H. Yakabe, Y. Babaa, T. Sakurai, and Y. Yoshitaka, J. Power Sources 135, 9 (2004). 10.1016/j.jpowsour.2003.11.049
22. J. Garcia-Barriocanal, A. Rivera-Calzada, M. Varela, Z. Sefrioui, E. Iborra, C. Leon, S. J. Pennycook, and J. Santamaria, Science 321, 676 (2008). 10.1126/science.1156393