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Volumn 405, Issue 1, 2010, Pages 204-210

Preparation and properties of Bi0.5Na0.5TiO 3 thin films by chemical solution deposition

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL COMPOSITIONS; CHEMICAL SOLUTION DEPOSITION; FIELD-INDUCED DISPLACEMENT; FILM CAPACITORS; HEATING CONDITIONS; METAL ALKOXIDES; POLARIZATION HYSTERESIS LOOPS; PREPARATION AND PROPERTIES; ROOM TEMPERATURE; SI SUBSTRATES; SINGLE-PHASE THIN FILMS; STABLE PRECURSORS; STRAIN LOOPS; TIO;

EID: 79955684874     PISSN: 00150193     EISSN: 15635112     Source Type: Journal    
DOI: 10.1080/00150193.2010.483201     Document Type: Conference Paper
Times cited : (11)

References (9)
  • 2
    • 33751283338 scopus 로고    scopus 로고
    • 3 perovskites and their solid solutions
    • 3 perovskites and their solid solutions. Ferroelectrics 315, 123-147 (2005).
    • (2005) Ferroelectrics , vol.315 , pp. 123-147
    • Buhrer, C.F.1
  • 4
    • 0348107228 scopus 로고    scopus 로고
    • Temperature dependence of the electrical and electromechanical properties of lead zirconate titanate thin films
    • H. Maiwa, S. H. Kim, and N. Ichinose, Temperature dependence of the electrical and electromechanical properties of lead zirconate titanate thin films. Appl. Phys. Lett. 83, 4369-4371 (2003).
    • (2003) Appl. Phys. Lett. , vol.83 , pp. 4369-4371
    • Maiwa, H.1    Kim, S.H.2    Ichinose, N.3
  • 7
    • 2942655380 scopus 로고    scopus 로고
    • Sample geometry effects on eleclric-field-induced displacements in piezoelectric thin films measured by atomic force microscopy
    • H. Okino, H. Matsuda, T. Iijima, S. Yokoyama, H. Funakubo, and T. Yamamoto, Sample geometry effects on eleclric-field-induced displacements in piezoelectric thin films measured by atomic force microscopy. Mater. Res. Soc. Symp. Proc. 784, 559-565 (2004).
    • (2004) Mater. Res. Soc. Symp. Proc. , vol.784 , pp. 559-565
    • Okino, H.1    Matsuda, H.2    Iijima, T.3    Yokoyama, S.4    Funakubo, H.5    Yamamoto, T.6
  • 9
    • 0032615192 scopus 로고    scopus 로고
    • Properties of aluminum nitride thin films for piezoelectric transducers and microwave filter applications
    • M. A. Dubois and P. Muralt, Properties of aluminum nitride thin films for piezoelectric transducers and microwave filter applications. Appl. Phys. Lett. 74, 3032-3034 (1999). (Pubitemid 129306918)
    • (1999) Applied Physics Letters , vol.74 , Issue.20 , pp. 3032-3034
    • Dubois, M.-A.1    Muralt, P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.