Piezoelectric properties of polar-axis-oriented ferroelectric Bi 4-xPrxTi3O12 thick films

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 43, Issue 9 B, 2004, Pages 6689-6691

  Matsuda, Hirofumi ^a   Ito, Sachiko ^a   Iijima, Takashi ^a   Mashimo, Tsubasa ^b   Okino, Hirotake ^b   Yamamoto, Takashi ^b  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b NATIONAL DEFENSE ACADEMY   (Japan)

Author keywords

Bismuth layer structured ferroelectric thin film; Chemical solution deposition; Ferroelectric property; Lead free piezoelectrics; Orientation control

Indexed keywords

ATOMIC FORCE MICROSCOPY; PIEZOELECTRIC MATERIALS; PRASEODYMIUM; SCANNING ELECTRON MICROSCOPY; THICK FILMS; TITANIUM OXIDES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

BISMUTH LAYER-STRUCTURED FERROELECTRIC THIN FILMS; CHEMICAL SOLUTION DEPOSITION (CSD); FERROELECTRIC PROPERTY; LEAD-FREE PIEZOELECTRICS; ORIENTATION CONTROL;

BISMUTH;

EID: 10444265878     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.43.6689     Document Type: Conference Paper

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